L79/HCS – Hall Effect Measurement System

L79/HCS – Hall Effect Measurement System

The L79/HCS System permits the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall constant. The roughed desktop setup offers different sample holders for various geometries and temperature requirements. An optional low temperature (LN2) attachment and a high temperature version up to 800°C ensure that all fields of application can be covered. Different permanent and electric magnets provide fixed or variable magnetic fields up to several Tesla.

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The L79/HCS System permits the characterization of semiconductor devices, it measures: mobility, resistivity, charge carrier concentration and Hall constant. The roughed desktop setup offers different sample holders for various geometries and temperature requirements. An optional low temperature (LN2) attachment and a high temperature version up to 800°C ensure that all fields of application can be covered. Different permanent and electric magnets provide fixed or variable magnetic fields up to several Tesla.