TFA – Thin Film Analyzer

TFA – Thin Film Analyzer

Revolutionary physical properties thin film characterization system. Highly integrated and easy to use measurement platform.

Physical properties of thin films differ from bulk material, as parasitic surface effects are much stronger due to smaller dimensions and high aspect ratios!

*Increasing influence of surface scattering
*Additional boundary scattering
*Quantum confinement for very thin layers

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Description

Revolutionary physical properties thin film characterization system. Highly integrated and easy to use measurement platform.

Physical properties of thin films differ from bulk material, as parasitic surface effects are much stronger due to smaller dimensions and high aspect ratios!

*Increasing influence of surface scattering
*Additional boundary scattering
*Quantum confinement for very thin layers